フェムト秒レーザとナノ秒レーザによる有機薄膜レーザ加工

Material type: 文書・図像類

Author: 津田, 紀生ほか

Publisher: 愛知工業大学

Publication date: 2015-09-30

Material Format: Digital

Capacity, size, etc.: -

NDC: -

View All

Notes on use

Note (General)：: Organic thin film is processed by femtosecond and nanosecond laser. Surface properties are evaluated by observation with laser microscope，and processi...

Search by Bookstore

Holdings of Libraries in Japan

This page shows libraries in Japan other than the National Diet Library that hold the material.

List of Cooperating Institutions and Databases

Please contact your local library for information on how to use materials or whether it is possible to request materials from the holding libraries.

other

AIT Associated Repository of Academic Resources
Digital
You can check the holdings of institutions and databases with which Institutional Repositories DataBase(IRDB)(Institutional Repository) is linked at the site of Institutional Repositories DataBase(IRDB)(Institutional Repository).
AIT Associated Repository of Academic Resources

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Digital

Material Type: 文書・図像類
Title: フェムト秒レーザとナノ秒レーザによる有機薄膜レーザ加工
Author/Editor: 津田, 紀生
牧野, 佑紀
小野, 秀介
山田, 諄
Author Heading: 津田, 紀生
牧野, 佑紀
小野, 秀介
山田, 諄
Publication, Distribution, etc.: 愛知工業大学
Publication Date: 2015-09-30
Publication Date (W3CDTF): 2015-09-30
Alternative Title: フェムトビョウレーザトナノビョウレーザニヨルユウキハクマクレーザカコウ
Organic Thin Film Laser Processing by Femtosecond Laser and Nanosecond Laser
Periodical title: 総合技術研究所研究報告=Bulletin of Research Institute for Industrial Technology.
No. or year of volume/issue: 17
Volume: 17
Pages: 41-45
ISSN (Periodical Title): ISSN : 1344-9672
Text Language Code: jpn
Target Audience: 一般
Note (General): Organic thin film is processed by femtosecond and nanosecond laser. Surface properties are evaluated by observation with laser microscope，and processing depth and area is measured. Radiation intensity from laser plasma near surface of organic thin film is observed using a spectrometer. Electron temperature is measured from the ratio of the spectral intensity. Femtosecond laser processing quality is better and the required laser energy is lower in comparison with nanosecond laser one.
identifier:http://repository.aitech.ac.jp/dspace/handle/11133/3065
Access Restrictions: 限定公開
Periodical Title (NCID): AA11484797
https://ci.nii.ac.jp/ncid/AA11484797
Data Provider (Database): 国立情報学研究所 : 学術機関リポジトリデータベース（IRDB）（機関リポジトリ）
https://irdb.nii.ac.jp
Original Data Provider (Database): 愛知工業大学 : 愛知工業大学学術情報リポジトリ