Journal of surface analysis

• Material Type: 雑誌
• ISSN: 1341-1756
• ISSN-L: 1341-1756
• Title: Journal of surface analysis
• Title Transcription: Journal of surface analysis
• Volume: 17(3) 2011.3
• Author/Editor: 表面分析研究会 編
• Author Heading: 表面分析研究会 ヒョウメン ブンセキ ケンキュウカイ ( 00284187 )Authorities
• Publication, Distribution, etc.: 東京 : 表面分析研究会
• Publication Date: 2011
• Publication Date (W3CDTF): 2011
• Note (Publication, distribution, etc.): 出版地の変更あり
• Year and volume of publication: v. 1, no. 1 (Mar. 1995)-
• Size: 30cm
• Place of Publication (Country Code): JP
• Text Language Code: jpn
• NDLC: ZM35
• Note (General): 本タイトル等は最新号による; 英文併載
• Holding library: 国立国会図書館
• Call No.: Z15-B66
• Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書; https://ndlsearch.ndl.go.jp
• Bibliographic ID (NDL): 000000095170; http://id.ndl.go.jp/bib/000000095170
• National Bibliography No. (JPNO): 00100920
• Cataloging Rule: National Diet Library Cataloging Rules for Serials
• Bibliographic Record Category (NDL): 131

Table of Contents

Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis

Invited, review: 45 years in Monte Carlo simulation for microbeam analysis: a personal retrospective review (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)

Invited paper: Surface characterization of nanoparticles: critical needs and significant challenges (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)

Invited, review: Surface sensitivity of Auger-electron spectroscopy and X-ray photoelectron spectroscopy (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)

Invited, review: Uncertainty in quantification of binary alloy films and thickness measurement of nm oxide films (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)