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Table of Contents
CONTENTS/
Stacking Fault Generation Suppression and Grown-In Defect Elimination in Dislocation Free Silicon Wafers by HCL Oxidation/Hiromitsu SHIRAKI/1~
New Methods of Vapour Phase Epitaxial Growth of GaAs/Hisashi SEKI ; Akinori KOOKITU ; Katuro OHTA ; Masatomo FUJIMOTO/11~
Temperature and Field Effects on Atomic Arrangements of Clean Tungsten Tip Surfaces Observed by FIM/Satoshi NISHIGAKI ; Shogo NAKAMURA/19~
Properties of Excited Surface-Wave Domains in CdS/Shigetaka MATSUMOTO ; Seijiro FURUKAWA/29~
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Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 雑誌
- Volume
- 15(1);JANUARY 1976
- Publication, Distribution, etc.
- Publication Date
- 1976-01
- Publication Date (W3CDTF)
- 1976-01
- Year and volume of publication
- 1(1):1962.7 - 20(12):1981.12
- Size
- 30 cm
- ISSN (Periodical Title)
- 0021-4922
- ISSN-L (Periodical Title)
- 0021-4922