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Table of Contents
CONTENTS/
Semiconductors//2439~
Characterization of Ultrashallow P⁺ Profiles by Spreading Resistance Measurements/Michel MINONDO ; Dominique ROCHE ; Claude JAUSSAUD/2439~
Annealing Behavior of Defects in Neutron-Transmutation-Doped Floating Zone Si/Xiangti MENG/2444~
Room-Temperature Photoreflectance Characterization of InAlAs/InGaAs Heterojunction Bipolar Transistor Structure Including Two-Dimensional Electron Gas/Yau-Huei CHEN ; Kuo-Tung HSU ; Kuo-Liang CHEN ; Hao-Hsiung LIN ; Gwo-Jen JAN/2448~
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Bibliographic Record
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- Material Type
- 雑誌
- ISSN
- 0021-4922
- ISSN-L
- 0021-4922
- Volume
- Part. 1Part. 133(5A)(401);MAY 1994
- Part Title
- Regular papers, brief communications & review papers : JJAP
- Author Heading
- 応用物理学会 オウヨウ ブツリ ガッカイ ( 00281497 )Authorities
- Publication, Distribution, etc.
- Publication Date
- 1994-05
- Publication Date (W3CDTF)
- 1994-05