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Table of Contents
CONTENTS/
Semiconductors//4393~
Determination of the Interface Trap Density in Metal Oxide Semiconductor Field-Effect Transistor through Subthreshold Slope Measurement/Jong-Son LYU ; Kee-Soo NAM ; Choochon LEE/4393~
Spectroscopic Ellipsometry Study of (111) and (100)Si Surfaces Etched in Aqueous KOH Solution/Sadao ADACHI ; Tomohiro IKEGAMI ; Katsuyuki UTANI/4398~
Composition and Growth Mechanisms of a Boron Layer Formed Using the Molecular Layer Doping Process/Naoto SAITOH ; Tadao AKAMINE ; Kenji AOKI ; Yoshikazu KOJIMA/4404~
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Bibliographic Record
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- Material Type
- 雑誌
- ISSN
- 0021-4922
- ISSN-L
- 0021-4922
- Volume
- Part. 1Part. 132(10)(389);OCTOBER 1993
- Part Title
- Regular papers, brief communications & review papers : JJAP
- Author Heading
- 応用物理学会 オウヨウ ブツリ ガッカイ ( 00281497 )Authorities
- Publication, Distribution, etc.
- Publication Date
- 1993-10
- Publication Date (W3CDTF)
- 1993-10