Analytical characterization of amorphous semiconductors and devices
Available with Digitized Contents Transmission Service
Find on the publisher's website
NDL Digital Collections
Available for viewing via the Digitized Contents Transmission Service for Individuals to official registered users of the NDL, who resides in Japan.
Search by Bookstore
Read this material in an accessible format.
Search by Bookstore
Read in Disability Resources
- Mina Search
- プレーンテキスト
Registered users of Mina Search can download or stream this content.
Bibliographic Record
You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.
- Material Type
- 博士論文
- Author/Editor
- 深田昇 [著]
- Author Heading
- 深田, 昇 フカダ, ノボル
- Alternative Title
- アモルファス半導体およびデバイスの分析・特性評価 アモルファス ハンドウタイ オヨビ デバイス ノ ブンセキ トクセイ ヒョウカ
- Degree Grantor
- 大阪大学
- Date Granted
- 昭和63年6月9日
- Date Granted (W3CDTF)
- 1988
- Dissertation Number
- 乙第4479号
- Degree Type
- 工学博士