The cover of this title could differ from library to library.

The cover of this title could differ from library to library.

Available with Digitized Contents Transmission Service

Find on the publisher's website

国立国会図書館デジタルコレクション

Available for viewing via the Digitized Contents Transmission Service for Individuals to official registered users of the NDL, who resides in Japan.

Become an official registered user >

Analytical characterization of amorphous semiconductors and devices

Call No. (NDL): UT51-63-N116
Bibliographic ID of National Diet Library: 000000204416
Persistent ID (NDL): info:ndljp/pid/12527402

Material type: 博士論文

Author: 深田昇 [著]

Publisher: -

Publication date: -

Material Format: Paper・Digital

Capacity, size, etc.: -

Name of awarding university/degree: 大阪大学,工学博士

Notes on use

Note (General)：: 博士論文

Search by Bookstore

Search by Bookstore

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper Digital

Material Type: 博士論文
Title: Analytical characterization of amorphous semiconductors and devices
Author/Editor: 深田昇 [著]
Author Heading: 深田, 昇フカダ, ノボル
Alternative Title: アモルファス半導体およびデバイスの分析・特性評価アモルファスハンドウタイオヨビデバイスノブンセキトクセイヒョウカ
Degree grantor/type: 大阪大学
Date Granted: 昭和63年6月9日
Date Granted (W3CDTF): 1988
Dissertation Number: 乙第4479号
Degree Type: 工学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT31
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-63-N116
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000204416
http://id.ndl.go.jp/bib/000000204416
Bibliographic Record Category (NDL): 213