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Characterization of Si-SiO[2] interface by the electrical conductivity at low temperatures

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Material Type: 博士論文
Title: Characterization of Si-SiO[2] interface by the electrical conductivity at low temperatures
Author/Editor: 八木厚夫 [著]
Author Heading: 八木, 厚夫ヤギ, アツオ
Alternative Title: MOS型電界効果トランジスタの低温に於ける電気伝導率の測定によるシリコン-二酸化シリコン界面の特性評価 MOSガタデンカイコウカトランジスタノテイオンニオケルデンキデンドウリツノソクテイニヨルシリコン - ニサンカシリコンカイメンノトクセイヒョウカ
Degree grantor/type: 学習院大学
Date Granted: 昭和56年3月7日
Date Granted (W3CDTF): 1981
Dissertation Number: 乙第34号
Degree Type: 理学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT21
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-63-V371
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000208694
http://id.ndl.go.jp/bib/000000208694
Bibliographic Record Category (NDL): 213