Studies of oxidation-induced stacking faults in silicon

Studies of oxidation-induced stacking faults in silicon

Call No. (NDL): UT51-59-K242
Bibliographic ID of National Diet Library: 000000214994

Material type: 博士論文

Author: 早藤貴範 [著]

Publisher: -

Date granted: 昭和59年3月27日

Material Format: Paper

Capacity, size, etc.: -

Degree grantor and degree: 関西学院大学,理学博士

Notes on use

Note (General)：: 博士論文

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Paper

Material Type: 博士論文
Title: Studies of oxidation-induced stacking faults in silicon
Author/Editor: 早藤貴範 [著]
Author Heading: 早藤, 貴範ハヤフジ, ヨシノリ
Extent: 冊
Alternative Title: シリコン結晶の熱酸化積層欠陥の研究シリコンケッショウノネツサンカセキソウケッカンノケンキュウ
Degree Grantor: 関西学院大学
Date Granted: 昭和59年3月27日
Date Granted (W3CDTF): 1984
Dissertation Number: 乙第101号
Degree Type: 理学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT21
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-59-K242
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000214994
http://id.ndl.go.jp/bib/000000214994
Bibliographic Record Category (NDL): 213