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二次イオン質量分析法による半導体材料の評価に関する研究

Call No. (NDL): UT51-63-U121
Bibliographic ID of National Diet Library: 000000215743
Persistent ID (NDL): info:ndljp/pid/12521314

Material type: 博士論文

Author: 本間芳和 [著]

Publisher: -

Publication date: -

Material Format: Paper・Digital

Capacity, size, etc.: -

Name of awarding university/degree: 東京大学,工学博士

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Note (General)：: 博士論文

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Material Type: 博士論文
Title: 二次イオン質量分析法による半導体材料の評価に関する研究
Title Transcription: ニジイオンシツリョウブンセキホウニヨルハンドウタイザイリョウノヒョウカニカンスルケンキュウ
Author/Editor: 本間芳和 [著]
Author Heading: 本間, 芳和ホンマ, ヨシカズ
Degree grantor/type: 東京大学
Date Granted: 昭和62年7月9日
Date Granted (W3CDTF): 1987
Dissertation Number: 乙第8466号
Degree Type: 工学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT31
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-63-U121
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000215743
http://id.ndl.go.jp/bib/000000215743
Bibliographic Record Category (NDL): 213