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In-situ high resolution electron microscopy observation of the interphase interfaces

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Material Type: 博士論文
Title: In-situ high resolution electron microscopy observation of the interphase interfaces
Author/Editor: 佐々木勝寛 [著]
Author Heading: 佐々木, 勝寛ササキ, カツヒロ
Alternative Title: 異相界面の高分解能電子顕微鏡法によるその場観察イソウカイメンノコウブンカイノウデンシケンビキョウホウニヨルソノバカンサツ
Degree grantor/type: 名古屋大学
Date Granted: 平成1年3月25日
Date Granted (W3CDTF): 1989
Dissertation Number: 甲第2197号
Degree Type: 工学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT31
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-89-G408
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000216512
http://id.ndl.go.jp/bib/000000216512
Bibliographic Record Category (NDL): 213