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国立国会図書館デジタルコレクション

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側貌頭部X線規格写真の分析時の計測誤差について

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Material Type: 博士論文
Title: 側貌頭部X線規格写真の分析時の計測誤差について
Title Transcription: ソクボウトウブ Xセンキカクシャシンノブンセキジノケイソクゴサニツイテ
Author/Editor: 翁文國 [著]
Author Heading: 翁, 文國オウ, ブンコク
Alternative Title: Studies on error in measurements from cephalometric analysis
Degree grantor/type: 日本大学
Date Granted: 平成1年11月27日
Date Granted (W3CDTF): 1989
Dissertation Number: 乙第3904号
Degree Type: 歯学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT26
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-90-C179
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000227871
http://id.ndl.go.jp/bib/000000227871
Bibliographic Record Category (NDL): 213