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Characterization of Ⅲ-V compound semiconductor interfaces by X-ray photoelectron spectroscopy

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Material Type: 博士論文
Title: Characterization of Ⅲ-V compound semiconductor interfaces by X-ray photoelectron spectroscopy
Author/Editor: 石井宏辰 [著]
Author Heading: 石井, 宏辰イシイ, ヒロタツ
Alternative Title: 光電子分光法によるⅢ-V族化合物半導体界面の評価コウデンシブンコウホウニヨル 3 - 5ゾクカゴウブツハンドウタイカイメンノヒョウカ
Degree grantor/type: 北海道大学
Date Granted: 平成4年3月25日
Date Granted (W3CDTF): 1992
Dissertation Number: 甲第3041号
Degree Type: 工学博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT31
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-92-H66
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000249591
http://id.ndl.go.jp/bib/000000249591
Bibliographic Record Category (NDL): 213