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X-ray characterization of a lapped asymmetrical silicon crystal for an intravenous coronary angiography system using synchrotron radiation

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CONTENTS
Chapter I Introduction
p1
I-1 K-edge subtraction system using synchrotron radiation and its significance for clinical medicine
p2
I-2 X-ray optics for increasing the integrated intensity
p5
Chapter II Purpose of research
p6

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Material Type: 博士論文
Title: X-ray characterization of a lapped asymmetrical silicon crystal for an intravenous coronary angiography system using synchrotron radiation
Author/Editor: 塩飽秀啓 [著]
Author Heading: 塩飽, 秀啓シワク, ヒデアキ
Degree grantor/type: 総合研究大学院大学
Date Granted: 平成4年3月16日
Date Granted (W3CDTF): 1992
Dissertation Number: 甲第8号
Degree Type: 学術博士
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
UT1
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-92-S331
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000254912
http://id.ndl.go.jp/bib/000000254912
Bibliographic Record Category (NDL): 213