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国立国会図書館デジタルコレクション
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Table of Contents
CONTENTS
p9
1 Introduction
p1
1.1 The background and motive of this study
p1
1.2 Problems to be solved and contents of this thesis
p13
2 The on-chip capacitance measurement technique for diffused and other internal lines in VLSI
p21
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Bibliographic Record
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- Material Type
- 博士論文
- Author/Editor
- 岩井洋 [著]
- Author Heading
- 岩井, 洋, 1949- イワイ, ヒロシ, 1949- ( 00919951 )Authorities
- Alternative Title
- 縮小したMOS電界効果トランジスタの二次元周辺効果 シュクショウシタ MOS デンカイ コウカ トランジスタ ノ ニジゲン シュウヘン コウカ
- Degree grantor/type
- 東京大学
- Date Granted
- 平成4年3月16日
- Date Granted (W3CDTF)
- 1992
- Dissertation Number
- 乙第10641号
- Degree Type
- 博士 (工学)