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博士論文

Fundamental study on hot electron interference phenomena by buried double slit in a semiconductor

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Fundamental study on hot electron interference phenomena by buried double slit in a semiconductor

Call No. (NDL)
UT51-98-B268
Bibliographic ID of National Diet Library
000000317967
Persistent ID (NDL)
info:ndljp/pid/3132776
Material type
博士論文
Author
本郷廣生 [著]
Publisher
-
Date granted
平成9年3月26日
Material Format
Paper・Digital
Capacity, size, etc.
-
Degree grantor and degree
東京工業大学,博士 (工学)
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博士論文

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Table of Contents

Provided by：国立国会図書館デジタルコレクション

  • 論文目録

  • Contents

    p1

  • 1 Introduction

    p1

  • 1.1 Historical Background

    p1

  • 1.2 Motivation

    p3

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Bibliographic Record

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Paper Digital

Material Type
博士論文
Title
Fundamental study on hot electron interference phenomena by buried double slit in a semiconductor
Author/Editor
本郷廣生 [著]
Author Heading
本郷, 廣生 ホンゴウ, ヒロオ
Alternative Title
半導体中埋め込みダブルスリットによるホットエレクトロン干渉現象に関する基礎的研究 ハンドウタイチュウ ウメコミ ダブル スリット ニ ヨル ホット エレクトロン カンショウ ゲンショウ ニ カンスル キソテキ ケンキュウ
Degree Grantor
東京工業大学
Date Granted
平成9年3月26日
Date Granted (W3CDTF)
1997
Dissertation Number
甲第3451号
Degree Type
博士 (工学)