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New specimen preparation methods for high-resolution electron microscopy and compositional analysis of a DRAM

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Material Type: 博士論文
Title: New specimen preparation methods for high-resolution electron microscopy and compositional analysis of a DRAM
Author/Editor: 川崎正博 [著]
Author Heading: 川崎, 正博カワサキ, マサヒロ
Degree grantor/type: 京都工芸繊維大学
Date Granted: 平成10年11月24日
Date Granted (W3CDTF): 1998
Dissertation Number: 乙第72号
Degree Type: 博士 (工学)
Note (Dissertation): 博士論文
Place of Publication (Country Code): JP
NDLC: UT51
Note (General): 博士論文
Holding library: 国立国会図書館
Call No.: UT51-2000-G277
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000000353516
http://id.ndl.go.jp/bib/000000353516
Bibliographic Record Category (NDL): 213