Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.

Author: Automated Testing for Electronics Manufacturing Conference (1984 : Anaheim, Calif.)

Notes on use

Note (General)：: Cover title: ATE West proceedings.Spine title: ATE West conference.

Search by Bookstore

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
Title: Proceedings : January 9-12, 1984, Anaheim Convention Center, Anaheim, CA / ATE West ; sponsored by Electronics test.
Title Heading: Electronics test.
Author Heading: Automated Testing for Electronics Manufacturing Conference (1984 : Anaheim, Calif.)
Publication, Distribution, etc.: New York : Morgan-Grampian Pub. Co.
Publication Date: c1984.
Publication Date (W3CDTF): 1984
Extent: 1 v. (various pagings) : ill. ; 28 cm.
Alternative Title: ATE West proceedings.
ATE West conference.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Automatic checkout equipment -- Congresses.
LCC: TK7895.A8
DDC: 681/.2
NDLC: M15
ND
Note (General): Cover title: ATE West proceedings.
Spine title: ATE West conference.
Note (Bibliography): Includes bibliographies.
Holding library: 国立国会図書館
Call No.: M15-A5893
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003112675
http://id.ndl.go.jp/bib/000003112675
LC Control Number: 84138179
https://lccn.loc.gov/84138179
Bibliographic Record Category (NDL): 211