Defects in SiO2 and related dielectrics : science and technology : Advanced study institute : Apr 2000, Erice, Italy. (NATO Science Series Sub-Series 2 Mathematics, Physics and Chemistry ; 2)

Defects in SiO2 and related dielectrics : science and technology : Advanced study institute : Apr 2000, Erice, Italy.

(NATO Science Series Sub-Series 2 Mathematics, Physics and Chemistry ; 2)

Call No. (NDL): M17-01-1173
Bibliographic ID of National Diet Library: 000003449768

Material type: 図書

Author: NATO.

Publisher: -

Publication date: -

Material Format: Paper

Capacity, size, etc.: v.

NDC: -

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Notes on use

Note (General)：: Papers.Index term: defects ; SiO2 ; NATO.

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Paper

Material Type: 図書
ISBN: 0792366859
Title: Defects in SiO2 and related dielectrics : science and technology : Advanced study institute : Apr 2000, Erice, Italy.
Series Title: NATO Science Series Sub-Series 2 Mathematics, Physics and Chemistry ; 2
Author Heading: NATO.
Extent: v.
Alternative Title: defects ; SiO2 ; NATO
NDLC: M17
Note (General): Papers.
Index term: defects ; SiO2 ; NATO.
Holding library: 国立国会図書館
Call No.: M17-01-1173
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003449768
http://id.ndl.go.jp/bib/000003449768
Bibliographic Record Category (NDL): 215