図書

The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.

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The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.

Call No. (NDL)
M17-92-0701-LS
Bibliographic ID of National Diet Library
000003488381
Material type
図書
Author
Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.ほか
Publisher
IEEE Computer Society Press
Publication date
1990.
Material Format
Microform
Capacity, size, etc.
v.
NDC
-
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Notes on use

Note (General)：

Papers.Also known as ITC. Held on fiche. IEEE cat no 90CM2910-8.Index term: test ; ITC ; IEEE....

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Microform

Material Type
図書
ISBN
0818620641 (pbk)
081869064X (hbk)
0818660643 (microfiche)
Title
The changing philosophy of test 21st International test conference : Sep 1990, Washington, DC.
Author Heading
Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.
IEEE Computer Society Press
Publication Date
1990.
Publication Date (W3CDTF)
1990
Extent
v.
Alternative Title
Also known as ITC. Held on fiche. IEEE cat no 90CM2910-8
test ; ITC ; IEEE
Note (Material Type)
[microform]