VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.ほか

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Note (General)：: Papers.Conference theme: Chip-to-system test concerns in the 90's. IEEE cat no 91TH0353-3.Index term: IEEE ; VLSI test....

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Material Type: 図書
ISBN: 0780301889 (pbk)
0780301897 (fiche)
Title: VLSI test : 9th Symposium : Apr 1991, Atlantic City, NJ.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.: IEEE
Publication Date: 1991.
Publication Date (W3CDTF): 1991
Extent: v.
Alternative Title: Conference theme: Chip-to-system test concerns in the 90's. IEEE cat no 91TH0353-3
IEEE ; VLSI test
NDLC: M17
ND
Note (General): Papers.
Conference theme: Chip-to-system test concerns in the 90's. IEEE cat no 91TH0353-3.
Index term: IEEE ; VLSI test.
BL shelfmark: q91/22670 Chip-to-system.
Holding library: 国立国会図書館
Call No.: M17-94-0805
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003493808
http://id.ndl.go.jp/bib/000003493808
UKMARC No.: G01762601
Bibliographic Record Category (NDL): 215