VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.ほか

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Note (General)：: Papers.Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2.Index...

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Material Type: 図書
ISBN: 0818654406 (pbk.)
0818654414 (microfiche)
Title: VLSI test : 12th Symposium : Apr 1994, Cherry Hill, NJ.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.: Los Alamitos, Calif. : IEEE Computer Society Press
Publication Date: c1994.
Publication Date (W3CDTF): 1994
Extent: v.
Alternative Title: Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2
VLSI test ; IEEE ; VTS
NDLC: M17
ND
Note (General): Papers.
Also known as VTS '94. Theme: Forces driving test technology in the nineties: economics, quality, and reliability. IEEE cat no 94TH0645-2.
Index term: VLSI test ; IEEE ; VTS.
BL shelfmark: 4363.2365 12th 1994.
Holding library: 国立国会図書館
Call No.: M17-95-0347
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003496501
http://id.ndl.go.jp/bib/000003496501
UKMARC No.: G02310320
Bibliographic Record Category (NDL): 215