ICMTS 1996 International conference on microelectronic test structures : Mar 1996, Trento, Italy.

Author: Institute of Electrical and Electronics Engineers. Electron Devices Society.

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Note (General)：: Papers.Held on fiche. IEEE cat no 96CM35832.Index term: microelectronic test structures ; ICMTS ; IEEE....

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Material Type: 図書
ISBN: 0780327845 (casebound)
0780327837 (pbk)
07803278503 (invalid but in book : microfiche)
Title: ICMTS 1996 International conference on microelectronic test structures : Mar 1996, Trento, Italy.
Author Heading: Institute of Electrical and Electronics Engineers. Electron Devices Society.
Publication, Distribution, etc.: IEEE
Publication Date: 1996.
Publication Date (W3CDTF): 1996
Extent: v.
Alternative Title: Held on fiche. IEEE cat no 96CM35832
microelectronic test structures ; ICMTS ; IEEE
Note (Material Type): [microform]
NDLC: M17
ND
Note (General): Papers.
Held on fiche. IEEE cat no 96CM35832.
Index term: microelectronic test structures ; ICMTS ; IEEE.
BL shelfmark: 6844.16712 1996.
Holding library: 国立国会図書館
Call No.: M17-97-0943-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003505194
http://id.ndl.go.jp/bib/000003505194
UKMARC No.: G05206735
Bibliographic Record Category (NDL): 215