6th Asian test symposium : Nov 1997, Akita, Japan.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee (TTTC)

Notes on use

Note (General)：: Selected papers and abstract.Also known as ATS '97. IEEE cat no 97TB100305.Index term: IEEE ; ATS ; test....

Search by Bookstore

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0818682094 (pbk)
0818682116 (microfiche)
0818682108 (case)
ISSN: 1081-7735
Title: 6th Asian test symposium : Nov 1997, Akita, Japan.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Test Technology Technical Committee (TTTC)
Publication, Distribution, etc.: IEEE
Publication Date: 1997.
Publication Date (W3CDTF): 1997
Extent: v.
Alternative Title: Also known as ATS '97. IEEE cat no 97TB100305
IEEE ; ATS ; test
NDLC: M17
ND
Note (General): Selected papers and abstract.
Also known as ATS '97. IEEE cat no 97TB100305.
Index term: IEEE ; ATS ; test.
BL shelfmark: 6842.48614 6th 1997.
Holding library: 国立国会図書館
Call No.: M17-98-1863
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003506799
http://id.ndl.go.jp/bib/000003506799
UKMARC No.: G05506755
Bibliographic Record Category (NDL): 215