16th VLSI test symposium : Apr 1998, Monterey, CA.

Author: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.ほか

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Note (General)：: Selected papers and abstracts.Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231...

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Material Type: 図書
ISBN: 0818684364 (pbk)
0818684380 (microfiche)
ISSN: 1093-0167
Title: 16th VLSI test symposium : Apr 1998, Monterey, CA.
Author Heading: Institute of Electrical and Electronics Engineers. Computer Society. Technical Committee on Test Technology.
Institute of Electrical and Electronics Engineers. Philadelphia Section.
Publication, Distribution, etc.: IEEE Computer Society Press
Publication Date: 1998.
Publication Date (W3CDTF): 1998
Extent: v.
Alternative Title: Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231
VLSI test ; IEEE ; VTS
NDLC: M17
ND
Note (General): Selected papers and abstracts.
Also known as VTS '98. Theme: Test innovations for highly complex, high speed, dop submicron ICs. IEEE cat no 98TB100231.
Index term: VLSI test ; IEEE ; VTS.
BL shelfmark: 4363.2365 16th 1998.
Holding library: 国立国会図書館
Call No.: M17-99-0575
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003508158
http://id.ndl.go.jp/bib/000003508158
UKMARC No.: G05673824
Bibliographic Record Category (NDL): 215