New applications in modelling and inversion techniques for non-destructive testing : Colloquium : Jan 1999, London, UK. (Colloquium Digest - IEE ; 1999-20)

New applications in modelling and inversion techniques for non-destructive testing : Colloquium : Jan 1999, London, UK.

(Colloquium Digest - IEE ; 1999-20)

Call No. (NDL): M17-99-1797
Bibliographic ID of National Diet Library: 000003509340

Material type: 図書

Author: Institution of Electrical Engineers. Science, Education and Technology Division. Professional Group S6 (Non-Destructive Testing and Evaluation)

Publisher: IEE

Publication date: 1999.

Material Format: Paper

Capacity, size, etc.: v.

NDC: -

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Notes on use

Note (General)：: Selected papers and programme.Index term: modelling techniques ; IEE ; non destructive testing.BL shelfmark: 3315.470 no 20 1999.

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Paper

Material Type: 図書
Title: New applications in modelling and inversion techniques for non-destructive testing : Colloquium : Jan 1999, London, UK.
Series Title: Colloquium Digest - IEE ; 1999-20
Author Heading: Institution of Electrical Engineers. Science, Education and Technology Division. Professional Group S6 (Non-Destructive Testing and Evaluation)
Publication, Distribution, etc.: IEE
Publication Date: 1999.
Publication Date (W3CDTF): 1999
Extent: v.
Alternative Title: modelling techniques ; IEE ; non destructive testing
NDLC: M17
M217
Note (General): Selected papers and programme.
Index term: modelling techniques ; IEE ; non destructive testing.
BL shelfmark: 3315.470 no 20 1999.
Holding library: 国立国会図書館
Call No.: M17-99-1797
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003509340
http://id.ndl.go.jp/bib/000003509340
UKMARC No.: G05805892
Bibliographic Record Category (NDL): 215