Pattern recognition, chemometrics, and imaging for optical environmental monitoring : Technical conference : Sep 1999, Boston, MA. (SPIE Proceedings ; 3854)

Pattern recognition, chemometrics, and imaging for optical environmental monitoring : Technical conference : Sep 1999, Boston, MA.

(SPIE Proceedings ; 3854)

Call No. (NDL): M17-00-0702
Bibliographic ID of National Diet Library: 000003510519

Material type: 図書

Author: SPIE-The International Society for Optical Engineering.

Publisher: SPIE

Publication date: 1999.

Material Format: Paper

Capacity, size, etc.: v.

NDC: -

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Notes on use

Note (General)：: Selected papers.Index term: pattern recognition ; SPIE ; chemometrics ; optical environmental monitoring.BL shelfmark: 6823.100 vol 3854 1999.

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Paper

Material Type: 図書
ISBN: 0819434477 (pbk)
ISSN: 0277-786X
Title: Pattern recognition, chemometrics, and imaging for optical environmental monitoring : Technical conference : Sep 1999, Boston, MA.
Series Title: SPIE Proceedings ; 3854
Author Heading: SPIE-The International Society for Optical Engineering.
Publication, Distribution, etc.: SPIE
Publication Date: 1999.
Publication Date (W3CDTF): 1999
Extent: v.
Alternative Title: pattern recognition ; SPIE ; chemometrics ; optical environmental monitoring
NDLC: M17
ME
Note (General): Selected papers.
Index term: pattern recognition ; SPIE ; chemometrics ; optical environmental monitoring.
BL shelfmark: 6823.100 vol 3854 1999.
Holding library: 国立国会図書館
Call No.: M17-00-0702
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003510519
http://id.ndl.go.jp/bib/000003510519
UKMARC No.: G05944586
Bibliographic Record Category (NDL): 215