Microelectronic test structures 11th International conference : Mar 1998, Kanazawa, Japan.

Author: Institute of Electrical and Electronics Engineers. Electron Devices Society.

Notes on use

Note (General)：: Papers.Also known as ICMTS 1998. Held on fiche. IEEE cat no 98CM36157.Index term: microelectronic test structures ; ICMTS ; IEEE....

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Material Type: 図書
ISBN: 0780343492 (casebound)
0780343484 (soft)
0780343506 (microfiche)
Title: Microelectronic test structures 11th International conference : Mar 1998, Kanazawa, Japan.
Author Heading: Institute of Electrical and Electronics Engineers. Electron Devices Society.
Publication, Distribution, etc.: IEEE
Publication Date: 1998.
Publication Date (W3CDTF): 1998
Extent: v.
Alternative Title: Also known as ICMTS 1998. Held on fiche. IEEE cat no 98CM36157
microelectronic test structures ; ICMTS ; IEEE
Note (Material Type): [microform]
NDLC: M17
ND
Note (General): Papers.
Also known as ICMTS 1998. Held on fiche. IEEE cat no 98CM36157.
Index term: microelectronic test structures ; ICMTS ; IEEE.
BL shelfmark: 6844.16712 1998.
Holding library: 国立国会図書館
Call No.: M17-99-0238-LS
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003510836
http://id.ndl.go.jp/bib/000003510836
UKMARC No.: G05666391
Bibliographic Record Category (NDL): 215