Polarization measurement, analysis, and applications 5 : 8-9 July 2002, Seattle, [Washington] USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4819)

Polarization measurement, analysis, and applications 5 : 8-9 July 2002, Seattle, [Washington] USA. : Jul 2002, Seattle, WA.

(SPIE Proceedings ; 4819)

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Material Type: 図書
ISBN: 0819445878
ISSN (series): 0277-786X
Title: Polarization measurement, analysis, and applications 5 : 8-9 July 2002, Seattle, [Washington] USA. : Jul 2002, Seattle, WA.
Series Title: SPIE Proceedings ; 4819
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 4819.
Author Heading: Society of Photo-Optical Instrumentation Engineers.
Goldstein, Dennis H.
Chenault, David B.
Boeing Company.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: vii, 206 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Polarimetry -- Congresses.
Polarization (Light) -- Measurement -- Congresses.
Optical instruments -- Design and construction -- Congresses.
LCC: QC440
DDC: 535.5/2/0287
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-205
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000003996063
http://id.ndl.go.jp/bib/000003996063
LC Control Number: 2003265066
https://lccn.loc.gov/2003265066
RLIN No.: DCLC2003265066-B
Bibliographic Record Category (NDL): 215