Nineteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2003 : San Jose, CA USA : March 11-13, 2003. : Mar 2003, San Jose, CA.

Call No. (NDL): M17-04-187
Bibliographic ID of National Diet Library: 000004190537

Material type: 図書

Author: IEEE Semiconductor Thermal Measurement and Management Symposium (19th : 2003 : San Jose, Calif.)

Publisher: IEEE

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: xiii, 404 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Papers.Title on cover.IEEE cat no 03CH37437 (softbound) , 03CH37437C (CD-ROM) .

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Paper

Material Type: 図書
ISBN: 0780377931 (softbound ed.)
078037794X (CD-ROM ed.)
ISSN: 1065-2221
Title: Nineteenth annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2003 : San Jose, CA USA : March 11-13, 2003. : Mar 2003, San Jose, CA.
Author Heading: IEEE Semiconductor Thermal Measurement and Management Symposium (19th : 2003 : San Jose, Calif.)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: xiii, 404 p. : ill. ; 28 cm.
Alternative Title: 19th annual IEEE semiconductor thermal measurement and management symposium : SEMI-THERM : proceedings 2003 : San Jose, CA USA : March 11-13, 2003
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Thermal properties -- Congresses.
Semiconductors -- Cooling -- Congresses.
LCC: TK7871.85
NDLC: M17
Note (General): Papers.
Title on cover.
IEEE cat no 03CH37437 (softbound) , 03CH37437C (CD-ROM) .
Note (Bibliography): Includes bibliographical references.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-04-187
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004190537
http://id.ndl.go.jp/bib/000004190537
RLIN No.: FLUGAPC4312-B
Bibliographic Record Category (NDL): 215