2001 6th international workshop on statistical methodology : IWSM : June 10, 2001/Kyoto : IWSM 2001 : Jun 2001, Kyoto, Japan.

Author: International Workshop on Statistical Metrology (6th : 2001 : Kyoto, Japan)

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Material Type: 図書
ISBN: 0780366883 (softbound)
Title: 2001 6th international workshop on statistical methodology : IWSM : June 10, 2001/Kyoto : IWSM 2001 : Jun 2001, Kyoto, Japan.
Author Heading: International Workshop on Statistical Metrology (6th : 2001 : Kyoto, Japan)
Publication, Distribution, etc.: Piscataway : IEEE
Publication Date: c2001.
Publication Date (W3CDTF): 2001
Extent: vi, 67 p. : ill. ; 30 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Semiconductors -- Characterization -- Statistical methods -- Congresses.
Semiconductors -- Measurement. -- Congresses.
NDLC: M17
Note (General): Program and papers.
IEEE cat no 01TH8550.
Note (Bibliography): Includes bibliographic references.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-03-2557
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004191636
http://id.ndl.go.jp/bib/000004191636
LC Control Number: 00111492
https://lccn.loc.gov/00111492
RLIN No.: MOHG48009001-B
Bibliographic Record Category (NDL): 215