Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002 : San Diego, USA. : 1st conference on nondestructive evaluation and reliability of micro- and nanomaterials systems : Mar 2002, San Diego, CA. (SPIE Proceedings ; 4703)

Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002 : San Diego, USA. : 1st conference on nondestructive evaluation and reliability of micro- and nanomaterials systems : Mar 2002, San Diego, CA.

(SPIE Proceedings ; 4703)

Call No. (NDL): M17-03-3943
Bibliographic ID of National Diet Library: 000004219618

Material type: 図書

Author: Meyendorf, Norbert.ほか

Publisher: SPIE

Publication date: c2002.

Material Format: Paper

Capacity, size, etc.: ix, 228 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 0819444510
ISSN (series): 0277-786X
Title: Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002 : San Diego, USA. : 1st conference on nondestructive evaluation and reliability of micro- and nanomaterials systems : Mar 2002, San Diego, CA.
Series Title: SPIE Proceedings ; 4703
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 4703.
Author Heading: Meyendorf, Norbert.
Baaklini, George Y.
Michel, Bernd.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2002.
Publication Date (W3CDTF): 2002
Extent: ix, 228 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Nanostructure materials -- Testing -- Congresses.
Microelectromechanical systems -- Evaluation.
Microelectromechanical systems -- Reliability.
Non-destructive testing -- Congresses.
Surfaces (Technology) -- Congresses.
Quality control -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-3943
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004219618
http://id.ndl.go.jp/bib/000004219618
RLIN No.: NYCGAUX1160-B
Bibliographic Record Category (NDL): 215