X-ray micro- and nano-focusing: applications and techniques 2 : 30 July 2001 : San Diego, USA. : Jul 2001, San Diego, CA. (SPIE Proceedings ; 4499)

X-ray micro- and nano-focusing: applications and techniques 2 : 30 July 2001 : San Diego, USA. : Jul 2001, San Diego, CA.

(SPIE Proceedings ; 4499)

Notes on use

Note (General)：: Papers."These proceedings mark the fourth SPIE conference in the field, ..." -- introd.

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 図書
ISBN: 0819442135
ISSN (series): 0277-786X
Title: X-ray micro- and nano-focusing: applications and techniques 2 : 30 July 2001 : San Diego, USA. : Jul 2001, San Diego, CA.
Series Title: SPIE Proceedings ; 4499
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering ; v. 4499.
Author Heading: McNulty, Ian.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2001.
Publication Date (W3CDTF): 2001
Extent: vii, 144 p. : ill. (some col.) ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: X-ray optics -- Congresses.
X-ray microscopy -- Congresses.
Imaging systems -- Congresses.
NDLC: M17
Note (General): Papers.
"These proceedings mark the fourth SPIE conference in the field, ..." -- introd.
Note (Bibliography): Includes bibliographical references and author index.
Holding library: 国立国会図書館
Call No.: M17-03-4713
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004243947
http://id.ndl.go.jp/bib/000004243947
RLIN No.: NYCGAUF4215-B
Bibliographic Record Category (NDL): 215