High purity silicon 6 : proceedings of the sixth international symposium. : 198th meeting of the Electrochemical Society : Oct 2000, Phoenix, AZ. (PV ; 2000-17) (SPIE Proceedings ; 4218)

High purity silicon 6 : proceedings of the sixth international symposium. : 198th meeting of the Electrochemical Society : Oct 2000, Phoenix, AZ.

(PV ; 2000-17) (SPIE Proceedings ; 4218)

Call No. (NDL): M17-03-4935
Bibliographic ID of National Diet Library: 000004248365

Material type: 図書

Author: Claeys, C. L.ほか

Publisher: Electrochemical Society

Publication date: c2000.

Material Format: Paper

Capacity, size, etc.: xix, 696 p. : ill. ; 24 cm.

NDC: -

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Note (General)：: Papers.

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Paper

Material Type: 図書
ISBN: 1566772842 (ECS)
0819438901 (SPIE)
Title: High purity silicon 6 : proceedings of the sixth international symposium. : 198th meeting of the Electrochemical Society : Oct 2000, Phoenix, AZ.
Series Title: PV ; 2000-17
SPIE Proceedings ; 4218
Title Heading: Proceedings (Electrochemical Society) ; 2000-17.
Author Heading: Claeys, C. L.
Electrochemical Society. Meeting (198th : 2000 : Phoenix, Ariz.)
International Symposium on High Purity Silicon (6th : 2000 : Phoenix, Ariz.)
Publication, Distribution, etc.: Pennington : Electrochemical Society
Bellingham : SPIE
Publication Date: c2000.
Publication Date (W3CDTF): 2000
Extent: xix, 696 p. : ill. ; 24 cm.
Alternative Title: High purity silicon 6 : proceedings of the 6th international symposium
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Silicon diodes -- Congresses.
Silicon crystals -- Congresses.
Crystal growth -- Congresses.
Semiconductor wafers -- Congresses.
NDLC: M17
Note (General): Papers.
Note (Bibliography): Includes bibliographic references and indexes.
Holding library: 国立国会図書館
Call No.: M17-03-4935
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004248365
http://id.ndl.go.jp/bib/000004248365
LC Control Number: 00106821
https://lccn.loc.gov/00106821
RLIN No.: CSUGA4501619-B
Bibliographic Record Category (NDL): 215