21st IEEE VLSI test symposium : proceedings : 27 April-1 May 2003 : Napa Valley, California. : VTS 2003 : Apr 2003, Napa Valley, CA. (IEEE VLSI Test Symposium)

21st IEEE VLSI test symposium : proceedings : 27 April-1 May 2003 : Napa Valley, California. : VTS 2003 : Apr 2003, Napa Valley, CA.

(IEEE VLSI Test Symposium)

Call No. (NDL): M17-04-1739
Bibliographic ID of National Diet Library: 000004261120

Material type: 図書

Author: IEEE VLSI Test Symposium (21st : 2003 : Napa Valley, Calif.)

Publisher: IEEE Computer Society

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: xxvii, 432 p. : ill. ; 28 cm.

NDC: -

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Note (General)：: Abstracts and papers.IEEE cat no PRO1924.

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Paper

Material Type: 図書
ISBN: 0769519245
ISSN (series): 1093-0167
Title: 21st IEEE VLSI test symposium : proceedings : 27 April-1 May 2003 : Napa Valley, California. : VTS 2003 : Apr 2003, Napa Valley, CA.
Series Title: IEEE VLSI Test Symposium
Author Heading: IEEE VLSI Test Symposium (21st : 2003 : Napa Valley, Calif.)
Publication, Distribution, etc.: Los Alamitos : IEEE Computer Society
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: xxvii, 432 p. : ill. ; 28 cm.
Alternative Title: VTS03 : 21st IEEE VLSI test symposium
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Integrated circuits -- Very large scale integration -- Testing. -- Congresses.
NDLC: M17
Note (General): Abstracts and papers.
IEEE cat no PRO1924.
Note (Bibliography): Includes bibliographical references and author index.
Note (Additional Physical Form Available): Also available via the World Wide Web.
Holding library: 国立国会図書館
Call No.: M17-04-1739
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004261120
http://id.ndl.go.jp/bib/000004261120
RLIN No.: MOHG52272849-B
Bibliographic Record Category (NDL): 215