Jump to main content
図書

Characterization and metrology for ULSI technology : 2003 international conference on characterization and metrology for ULSI technology : Austin, Texas 24-28 March 2003. : Mar 2003, Austin, TX. (AIP Conference Proceedings ; 683)

Icons representing 図書

Characterization and metrology for ULSI technology : 2003 international conference on characterization and metrology for ULSI technology : Austin, Texas 24-28 March 2003. : Mar 2003, Austin, TX.

(AIP Conference Proceedings ; 683)

Call No. (NDL)
M17-04-1460
Bibliographic ID of National Diet Library
000004300052
Material type
図書
Author
Seiler, David G.ほか
Publisher
American Institute of Physics
Publication date
c2003.
Material Format
Paper
Capacity, size, etc.
xviii, 818 p. : ill. ; 28 cm.
NDC
-
View All

Notes on use

Note (General):

Papers.Accompanying computer disc contains full text from the book.

Accompanying material:

With a CD-ROM.

Search by Bookstore

Bibliographic Record

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Paper

Material Type
図書
ISBN (set)
0735401527 (set)
ISSN (series)
0094-243X
Publication, Distribution, etc.
Publication Date
c2003.
Publication Date (W3CDTF)
2003