Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA. (SPIE Proceedings ; 5190)

Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA.

(SPIE Proceedings ; 5190)

Call No. (NDL): M17-04-1394
Bibliographic ID of National Diet Library: 000004314927

Material type: 図書

Author: Decker, Jennifer E.ほか

Publisher: SPIE

Publication date: c2003.

Material Format: Paper

Capacity, size, etc.: xi, 478 p. : ill. ; 28 cm.

NDC: -

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Notes on use

Note (General)：: Selected papers."the joint session with conference 5188 Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (...) "...

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Paper

Material Type: 図書
ISBN: 0819450634
ISSN (series): 0277-786X
Title: Recent developments in traceable dimensional measurements 2 : 4-6 August 2003 : San Diego, California, USA. : Aug 2003, San Diego, CA.
Series Title: SPIE Proceedings ; 5190
Title Heading: Proceedings of SPIE -- the International Society for Optical Engineering. v. 5190.
Author Heading: Decker, Jennifer E.
Brown, Nicholas.
Publication, Distribution, etc.: Bellingham : SPIE
Publication Date: c2003.
Publication Date (W3CDTF): 2003
Extent: xi, 478 p. : ill. ; 28 cm.
Place of Publication (Country Code): US
Text Language Code: eng
Subject Heading: Optical measurements -- Congresses.
Optical measurements -- Industrial applications -- Congresses.
Optical instruments -- Design and construction -- Congresses.
Measuring instruments -- Design and construction -- Congresses.
Laser interferometers -- Congresses.
Mensuration. -- Congresses.
NDLC: M17
Note (General): Selected papers.
"the joint session with conference 5188 Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (...) " -- introduction.
Note (Bibliography): Includes bibliographic references and author index.
Holding library: 国立国会図書館
Call No.: M17-04-1394
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004314927
http://id.ndl.go.jp/bib/000004314927
RLIN No.: MOHG53842150-B
Bibliographic Record Category (NDL): 215