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規格・テクニカルリポート類

Development of a Theoretical Model for Annealing of Radiation Damage in Semiconductor Devices. Quarterly Report, March 8-June 8, 1987. Quarterly Report, 8 Mar. - 8 Jun. 1987 NASA-CR-180394 N87-24211 NAS-126180394 Q-2

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Development of a Theoretical Model for Annealing of Radiation Damage in Semiconductor Devices. Quarterly Report, March 8-June 8, 1987. Quarterly Report, 8 Mar. - 8 Jun. 1987

NASA-CR-180394 N87-24211 NAS-126180394 Q-2

Call No. (NDL)
LS-N87/24211
Bibliographic ID of National Diet Library
000004946446
Material type
規格・テクニカルリポート類
Author
Litovchenko, V
Publisher
-
Publication date
-
Material Format
Microform
Capacity, size, etc.
microfiche 5 p
NDC
-
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Microform

Material Type
規格・テクニカルリポート類
Author/Editor
Litovchenko, V
Extent
microfiche 5 p
Note (Material Type)
[microform]
Report No.
テクニカルリポート番号 : NASA-CR-180394
テクニカルリポート番号 : N87-24211
テクニカルリポート番号 : NAS-126180394
テクニカルリポート番号 : Q-2
Holding library
国立国会図書館
Call No.
LS-N87/24211
Data Provider (Database)
国立国会図書館 : 国立国会図書館蔵書
Bibliographic ID (NDL)
000004946446