Heavy Ion Induced Single Event Phenomena (SEP) Data for Semiconductor Devices from Engineering Testing NASA-CR-184864 N89-20821 NAS-126184864 JPL-PUBL-8817

Heavy Ion Induced Single Event Phenomena (SEP) Data for Semiconductor Devices from Engineering Testing

NASA-CR-184864 N89-20821 NAS-126184864 JPL-PUBL-8817

Call No. (NDL): LS-N89/20821
Bibliographic ID of National Diet Library: 000004949191

Material type: 規格・テクニカルリポート類

Author: Nichols, D. Kほか

Publisher: -

Publication date: -

Material Format: Microform

Capacity, size, etc.: microfiche 71 p

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Microform

Material Type: 規格・テクニカルリポート類
Title: Heavy Ion Induced Single Event Phenomena (SEP) Data for Semiconductor Devices from Engineering Testing
Author/Editor: Nichols, D. K
Huebner, M. A
Price, W. E
Smith, L. S
Coss, J. R
Extent: microfiche 71 p
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : NASA-CR-184864
テクニカルリポート番号 : N89-20821
テクニカルリポート番号 : NAS-126184864
テクニカルリポート番号 : JPL-PUBL-8817
Holding library: 国立国会図書館
Call No.: LS-N89/20821
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000004949191
http://id.ndl.go.jp/bib/000004949191
Bibliographic Record Category (NDL): 291