Phenomenological model for the effect of nanocrystalline microstructure on irradiation-induced amorphization in U(sub 3)Si ANL/ET/CP-83901 DE95 004631 CONF-94114420

Phenomenological model for the effect of nanocrystalline microstructure on irradiation-induced amorphization in U(sub 3)Si

ANL/ET/CP-83901 DE95 004631 CONF-94114420

Call No. (NDL): LS-DE95/004631
Bibliographic ID of National Diet Library: 000005513373

Material type: 規格・テクニカルリポート類

Author: Rest, J

Publisher: -

Publication date: 1994

Material Format: Microform

Capacity, size, etc.: 7 p. (1 microfiche)

NDC: -

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Material Type: 規格・テクニカルリポート類
Title: Phenomenological model for the effect of nanocrystalline microstructure on irradiation-induced amorphization in U(sub 3)Si
Author/Editor: Rest, J
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 7 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/ET/CP-83901
テクニカルリポート番号 : DE95 004631
テクニカルリポート番号 : CONF-94114420
Holding library: 国立国会図書館
Call No.: LS-DE95/004631
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005513373
http://id.ndl.go.jp/bib/000005513373
Bibliographic Record Category (NDL): 291