Radiation-induced segregation: A microchemical gauge to quantify fundamental defect parameters PNL-SA-24864 DE95 005720 CONF-94114450

Radiation-induced segregation: A microchemical gauge to quantify fundamental defect parameters

PNL-SA-24864 DE95 005720 CONF-94114450

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Material Type: 規格・テクニカルリポート類
Title: Radiation-induced segregation: A microchemical gauge to quantify fundamental defect parameters
Author/Editor: Simonen, E. P
Bruemmer, S. M
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : PNL-SA-24864
テクニカルリポート番号 : DE95 005720
テクニカルリポート番号 : CONF-94114450
Holding library: 国立国会図書館
Call No.: LS-DE95/005720
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005517177
http://id.ndl.go.jp/bib/000005517177
Bibliographic Record Category (NDL): 291