Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer UCRL-JC-118213 DE95 008829 CONF-94072336

Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer

UCRL-JC-118213 DE95 008829 CONF-94072336

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Material Type: 規格・テクニカルリポート類
Title: Integrated X-ray testing of the electro-optical breadboard model for the XMM reflection grating spectrometer
Author/Editor: Bixler, J. V
Craig, W
Decker, T
Aarts, H
Boggende, T
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 12 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-118213
テクニカルリポート番号 : DE95 008829
テクニカルリポート番号 : CONF-94072336
Holding library: 国立国会図書館
Call No.: LS-DE95/008829
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005518634
http://id.ndl.go.jp/bib/000005518634
Bibliographic Record Category (NDL): 291