Uses of electron beam ion traps in the study of highly charged ions UCRL-JC-119193 DE95 011537 CONF-94071662

Uses of electron beam ion traps in the study of highly charged ions

UCRL-JC-119193 DE95 011537 CONF-94071662

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Material Type: 規格・テクニカルリポート類
Title: Uses of electron beam ion traps in the study of highly charged ions
Author/Editor: Knapp, D
Publication Date: 1994
Publication Date (W3CDTF): 1994
Extent: 25 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-119193
テクニカルリポート番号 : DE95 011537
テクニカルリポート番号 : CONF-94071662
Holding library: 国立国会図書館
Call No.: LS-DE95/011537
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005522257
http://id.ndl.go.jp/bib/000005522257
Bibliographic Record Category (NDL): 291