Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability SAND-95-1752C DE95 016403 CONF-95071602

Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability

SAND-95-1752C DE95 016403 CONF-95071602

Call No. (NDL): LS-DE95/016403
Bibliographic ID of National Diet Library: 000005535599

Material type: 規格・テクニカルリポート類

Author: Stevenson, J. Oほか

Publisher: -

Publication date: 1995

Material Format: Microform

Capacity, size, etc.: 8 p. (1 microfiche)

NDC: -

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Material Type: 規格・テクニカルリポート類
Title: Inspection of chemically roughened copper surfaces using optical interferometry and scanning electron microscopy: Establishing a correlation between surface morphology and solderability
Author/Editor: Stevenson, J. O
Hosking, F. M
Guilinger, T. R
Yost, F. G
Sorensen, N. R
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-95-1752C
テクニカルリポート番号 : DE95 016403
テクニカルリポート番号 : CONF-95071602
Holding library: 国立国会図書館
Call No.: LS-DE95/016403
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005535599
http://id.ndl.go.jp/bib/000005535599
Bibliographic Record Category (NDL): 291