Novel ellipsometer design for the study of large thin films BNL-61989 DE95 016020 CONF-95079316

Novel ellipsometer design for the study of large thin films

BNL-61989 DE95 016020 CONF-95079316

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Material Type: 規格・テクニカルリポート類
Title: Novel ellipsometer design for the study of large thin films
Author/Editor: Lin, Y
Premuzic, E
Lin, M
Publication Date: 1995
Publication Date (W3CDTF): 1995
Extent: 10 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-61989
テクニカルリポート番号 : DE95 016020
テクニカルリポート番号 : CONF-95079316
Holding library: 国立国会図書館
Call No.: LS-DE95/016020
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005538383
http://id.ndl.go.jp/bib/000005538383
Bibliographic Record Category (NDL): 291