Comparing TOF-SIMS with laser desorption/photoionization for surface analysis ANL/CHM/CP-88956 DE96 011907 CONF-96051792

Comparing TOF-SIMS with laser desorption/photoionization for surface analysis

ANL/CHM/CP-88956 DE96 011907 CONF-96051792

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Material Type: 規格・テクニカルリポート類
Title: Comparing TOF-SIMS with laser desorption/photoionization for surface analysis
Author/Editor: Trevor, J. L
Hanley, L
Pellin, M. J
Lykke, K. R
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 3 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/CHM/CP-88956
テクニカルリポート番号 : DE96 011907
テクニカルリポート番号 : CONF-96051792
Holding library: 国立国会図書館
Call No.: LS-DE96/011907
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005856069
http://id.ndl.go.jp/bib/000005856069
Bibliographic Record Category (NDL): 291