NiO exchange bias layers grown by direct ion beam sputtering of a nickel oxide target UCRL-JC-122960 DE96 010365 CONF-96042510

NiO exchange bias layers grown by direct ion beam sputtering of a nickel oxide target

UCRL-JC-122960 DE96 010365 CONF-96042510

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Material Type: 規格・テクニカルリポート類
Title: NiO exchange bias layers grown by direct ion beam sputtering of a nickel oxide target
Author/Editor: Michel, R. P
Chaiken, A
Johnson, L. E
Kim, Y. K
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : UCRL-JC-122960
テクニカルリポート番号 : DE96 010365
テクニカルリポート番号 : CONF-96042510
Holding library: 国立国会図書館
Call No.: LS-DE96/010365
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005856291
http://id.ndl.go.jp/bib/000005856291
Bibliographic Record Category (NDL): 291