Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors SAND-96-0563C DE96 006384 CONF-9607732

Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors

SAND-96-0563C DE96 006384 CONF-9607732

Call No. (NDL): LS-DE96/006384
Bibliographic ID of National Diet Library: 000005858035

Material type: 規格・テクニカルリポート類

Author: Witczak, S. Cほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 5 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Accelerated tests for bounding the low dose rate radiation response of lateral PNP bipolar junction transistors
Author/Editor: Witczak, S. C
Schrimpf, R. D
Galloway, K. F
Schmidt, D. M
Fleetwood, D. M
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 5 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : SAND-96-0563C
テクニカルリポート番号 : DE96 006384
テクニカルリポート番号 : CONF-9607732
Holding library: 国立国会図書館
Call No.: LS-DE96/006384
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005858035
http://id.ndl.go.jp/bib/000005858035
Bibliographic Record Category (NDL): 291