Long term instability in the defect assembly in irradiated high resistivity silicon detectors BNL-63117 DE96 011496 CONF-9611233

Long term instability in the defect assembly in irradiated high resistivity silicon detectors

BNL-63117 DE96 011496 CONF-9611233

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Material Type: 規格・テクニカルリポート類
Title: Long term instability in the defect assembly in irradiated high resistivity silicon detectors
Author/Editor: Eremin, V
Ivanov, A
Verbitskaya, E
Li, Z
Schmidt, B
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 3 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-63117
テクニカルリポート番号 : DE96 011496
テクニカルリポート番号 : CONF-9611233
Holding library: 国立国会図書館
Call No.: LS-DE96/011496
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005859678
http://id.ndl.go.jp/bib/000005859678
Bibliographic Record Category (NDL): 291