Transmission electron microscopy study in-situ of radiation-induced defects in copper at elevated temperatures ANL/MSD/CP-90423 DE97 001983 CONF-96120254

Transmission electron microscopy study in-situ of radiation-induced defects in copper at elevated temperatures

ANL/MSD/CP-90423 DE97 001983 CONF-96120254

Call No. (NDL): LS-DE97/001983
Bibliographic ID of National Diet Library: 000005865918

Material type: 規格・テクニカルリポート類

Author: Daulton, T. Lほか

Publisher: -

Publication date: 1996

Material Format: Microform

Capacity, size, etc.: 8 p. (1 microfiche)

NDC: -

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Microform

Material Type: 規格・テクニカルリポート類
Title: Transmission electron microscopy study in-situ of radiation-induced defects in copper at elevated temperatures
Author/Editor: Daulton, T. L
Kirk, M. A
Rehn, L. E
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 8 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : ANL/MSD/CP-90423
テクニカルリポート番号 : DE97 001983
テクニカルリポート番号 : CONF-96120254
Holding library: 国立国会図書館
Call No.: LS-DE97/001983
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005865918
http://id.ndl.go.jp/bib/000005865918
Bibliographic Record Category (NDL): 291