Study of bulk damage in high resistivity silicon detectors irradiated by high dose of (sup 60)Co (gamma)-radiation BNL-63019 DE96 011030 CONF-9611231

Study of bulk damage in high resistivity silicon detectors irradiated by high dose of (sup 60)Co (gamma)-radiation

BNL-63019 DE96 011030 CONF-9611231

You can check the details of this material, its authority (keywords that refer to materials on the same subject, author's name, etc.), etc.

Material Type: 規格・テクニカルリポート類
Title: Study of bulk damage in high resistivity silicon detectors irradiated by high dose of (sup 60)Co (gamma)-radiation
Author/Editor: Li, Z
Li, C. J
Publication Date: 1996
Publication Date (W3CDTF): 1996
Extent: 4 p. (1 microfiche)
Note (Material Type): [microform]
Report No.: テクニカルリポート番号 : BNL-63019
テクニカルリポート番号 : DE96 011030
テクニカルリポート番号 : CONF-9611231
Holding library: 国立国会図書館
Call No.: LS-DE96/011030
Data Provider (Database): 国立国会図書館 : 国立国会図書館蔵書
https://ndlsearch.ndl.go.jp
Bibliographic ID (NDL): 000005866465
http://id.ndl.go.jp/bib/000005866465
Bibliographic Record Category (NDL): 291